A Self-testing Approach to Testing of Mixed Analog- Digital Microsystems Based on Microcontrollers
نویسنده
چکیده
−A new approach based on the 4D method [1,2] is proposed to self-testing of analog networks (circuits) of mixed analog-digital microsystems controlled by microcontrollers. It is characterised by simplicity and facility of the implementation of diagnosis algorithms in simple and popular microcontrollers. In the paper the creation of a fault dictionary and self-testing procedures of analog networks (single soft fault detection and localisation) for these microsystems are described.
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